Electromagnetic inspection



Sept 21, 1943. T. ZUSCHLAG ELECTROMAGNETIC INSPECTION Filed New a, 194i 2 Sheets-Sheet 1 I H l' i I Sept EH, 1943, T. ZUSCHLAG ELECTROMAGNETIC INSPECTION Filed Nov. 6

, 1941 2 Sheets-Sheet 2 m m 2 N E 6 Wm v0 w m m W W 6 Patented Sept. 21, 1943.-

19 Claims.

This invention relates to" the art of non-dew structive testing and inspection of metallic material, and more especially to electromagnetic inspection of such material by the use of alternating current fields. Specifically, the invention contemplates the use of two separate sources of alternating current and the observation of diilerences. between the voltages and phases of such sources resulting from the presence of varia ions or of defects in the material under inspection.

This application is a continuation in part of my application for U. 8. Letters Patent Serial No, 415,551, filed October 18, 1941. According to the invention of the mentioned application a detector circuit or a secondary circuit, or both, is provided to balance the voltage developed by an oscillator against another voltage developed in an auxiliary circuit but derived from the same oscillator. In accordance with the present invention two separate oscillators are provided. the second oscillator being part of an'auxiliary oscillator system, and the voltage output developed by this auxiliary'system is, compared, as to magnitude and phase'or frequency, with the voltage output of the main oscillator system. In order to make this comparison of voltages HIECTROMAGNETEC INSPECTION Theodore Zuschlag. West Englewood, N. 5., as-

signor to Magnetic Analysis Corporation, Long Island City, N. Y., a corporation oi New Yo k Application November 6, 1941. Serial No. 417,976

structure, composition and physical dimensions,

' as well as fiaws such as seams, cracks and cavithe two oscillators should be synchronized as to frequency under "standard conditions.

Methods and apparatus heretofore proposed for electromagnetic inspection of metallic materials have included the use of alternating current for energizing the material as is done in the present case, but one dimculty usually present in such former systems has been in maintaining the energizing coil 'tuned to the frequency of the source of alternating current. By utilizing apparatus in certain "respects similar to that of my mentioned prior application, the present invention overcomes this dimcultyby including an oscillator as a part of each energizing system to furnish the alternating current. Furthermore the oscillators are preferably of the variable feedback type employed in such manner as'to provide maximum reaction in the presence of defects and variations in the material under test. 7

Other features of this invention comprise an improved pickup system including detector coils so related to the several circuits thatone or more indicating devices coupled thereto will give extremelysensitive indication of variations or ties. By employing an oscillograph as one of the indicating devices of the present invention in combination with the auxiliary oscillator, it is possible to.observe not only the extent and nature of. defects and changes in the material,

but also the magnitudes of such defects and changes, which is not possible with the apparatus of my prior application abovereferred to The foregoing and additional advantages introduced by this invention will become more apparent upon consideration of the following specification taken together with the drawings, wherein:

Fig. 1 is a circuit diagram ofone embodiment of the invention wherein a voltage produced in a tuned energizing coil which is energized by a main oscillator is compared with'a-voltage produced in a standard 0011' by'an auxiliary oscillator, the standard coil not being in-inductive relation to the object under test. This embodiment is especially. useful for indicating variations in the composition of the material under test and also for indicating the extent and magnitude of defects and variations.

Fig. 2 is. a circuit diagram of a preferred em bodiment of the invention which combines features of the circuit of Fig. 1 with features mak- 1 ing possible additionally the indication of the nature, magnitude and extent of structural defects in the material under test and with greatly increased sensitivity.

Figs. 3 and..4 illustrate the manner in which the coils of Figs. 1 and 2 may be physicallydisposed in two altematlve arrangements;

Referring now to the circuit diagram of Fig.

1, the apparatus included within the dash-line rectangle I comprises an oscillator of the variable feedback type. An oscillator of this type is described in my copending U. S. patent application, Ser. No. 301,179, filed Oct. 25, 1939, now Patent No. 2,267,884. This oscillator. includes two three-electrode, vacuum tubes 2i and 22, and preferably they may comprise a tube of twin-type construction such as that known as type 6F8. The anode of tube 2! iscoupled by means of condenser 23to the adjustable potentiometer 24, the slider of which is connected to the grid-of tube 22. This potentiometer thus controls the magnitude of voltage impressed on the grid'or tube 22 which is derived from the output'of' tube 2|. 'I'he cathodes of tubes 2| and 22 are coupled to ground through cathode biasing networks consisting of resistors 25 and 2Bshunted by condensers 21 and 28, respectively. The anode of tube 22 is connected to the positive pole of potential source 33 through fixed resistor 29, and is coupled to potentiometer 3| through coupling condenser 30. The slider of potentiometer 3I, which adjusts the effective amplification of tube 2|, is connected to the grid of tube 2I. Thus the output of tube 22 is coupled-- to the input of tube 2| by condenser 30 and potentiometer 3|. V

In addition to being coupled to the input of tube 22 the output of tube 2i (which is also the output of the oscillator) is connected to tuned circuit 2 which consists of an alternating current energizing coil or oscillator primary 3 and fixed condenser 5. The anode circuit of tube 2| is completed through coil 3 through variable resistance 45 to the positive terminal of anode potential source 33. The anode of tube 22 also derives its anode potential from the same source but through resistance 28. The function of rheostat Mi will be described later.

A separate oscillator IOI of the feedback type is shown enclosed in a separate dash-line rectangle. This may be termed the auxiliary oscillater and may be understood to comprise elements similar to those of main oscillator I. The corresponding elements thereof are marked with the same reference characters as the elements of oscillator I, plus I00. The anode of tube IZI oi oscillator IOI is connected to tuned circuit 31 which comprises primary energizing coil 35 in series with the variocoupler primary winding 39, both ofwhich are shunted by variable condenser 381 Coil 30 may be considered as a "standard" coil. The secondary coil 36 coupled to primary coil 35 is connected in series with the adjustable variocoupler secondary and is connected in opposition with the detector coil or secondary II I coupled to energizing'primary coil 3. Secondary coils 60 and 36 and primary coils 39 and 35 may be combined into one movable secondary coil and one primary coil, respectively, with a somewhat decreased fineness of control and a somewhat decreased sensitivity. The anode of tube I2I is furnished with anode potential through rheostat 46, as is that of tube 2|. The anode of tube I22 is furnished with anode potential through resistor I 29 in a manner corresponding to that described in connection with tube 22.

In addition to the coil system including coils 3 and I I I which are arranged to be placed in magnetic relation to the object 20 under test, there is provided a direct-current energizing coil I6 which is connected in series with direct-current source I'I, switch I8 and control rheostat I9, which is variable to control the strength of the direct-current magnetic field set up by coil I5. I have found that a cell having about 4,000 or 5,000 ampere turns is sufficient. The manner of use of this direct-current circuit will be described below. Coils 3, III and I6 are preferably disposed in a symmetrical assembly and arranged to be placed in inductive relation to the article under test or inspection, as represented by the bar 20. Usually this material under test would be placed either within the mentioned coils, as shown in Fig. 3, or symmetrically adjacent them, as shownin Fig. 4.

Energizing coil 3 is inductively coupled to the secondary or detector coil III, and primary energizing coil 35 is coupled to secondary coil 36. Coils III and 36 are connected in a secondary or detector circuit which also includes in series a coil 3, and secondary or detector coil III.

variocoupler secondary coil 40 and tuning condenser II3. This series circuit is connected to the input terminals of an indicating device 44, here represented as an oscillograph of the cathode-ray type. It may be assumed that the two binding posts marked V" at the left in the drawings (where the oscillograph M is represented) are connected to the "vertical" plates of the oscillograph and the two binding posts marked H" on the right are connected to the "horizontal" plates, and that the local or sweep-circuit oscillator.usually included in such an oscillograph would not be utilized. Although in the system of the present invention which includes two oscillators, the use of an oscillograph as an indicating device introduces certain important advantages,

itis nevertheless feasible to substitute for the oscillograph shown an indicating meter such as a milliammeter. In this event the center lead of the three connections, as shown, to the oscillograph would be broken and the indicating meter would be coupled across the terminals of the variable condenser II3. Such an arrangement is illustrated in Fig. 2 of my mentioned application, Serial No. 415,551. The purpose of tuning condenser I I3 is to increase the voltage impressed on the indicating device at' the desired frequency and to decrease the voltages at undesired, usually harmonic, frequencies.

For convenience the apparatus above described in connection with Fig. 1 may be considered to be divided into two systems, namely an oscillator system and an auxiliary system. The oscillator system comprises oscillator I, energizing Coils 3 and III of this system together with coil it of the direct-current system are arranged to be placed in inductive relation to the material under test. The auxiliary system comprises auxiliary oscillator I0 I, auxiliary primary coil 35 and variocoupler primary 39 and their respective secondary coils 38 and 40. These auxiliary coils are not in inductive relation with the article under test. Detector coll III is both a part of the auxiliary system and of the oscillator system because it is electrically connected to a coil in the first and inductively coupled to a coil in the second. Alternatively, these two systems may be termed respectively the main oscillator system and the auxiliary oscillator system, the reason for which will be more apparent upon consideration of Fig. 2.

The system of Fig. 1 is adjusted as follows: Potentiometers 24 and 3| are first adjusted to place main oscillator I in oscillating condition, while oscillograph 44 is observed. If coils 40, 36 and III are connected across the vertical plates of this oscillograph a relatively large pattern will suddenly appear, after which by careful manipulation of potentiometers 24 and 3| this pattern can be decreased to a minimum size indicating that the oscillator I is oscillating, but not violently. Assuming that the specimen 20 under test, which may be either moving or stationary, is placed in inductive relation with the coils-3, I II and I 5 direct current may be caused to flow in coi1,l6, by closure of switch'l8. Next potentiometers I24 and I3! of oscillator IOI are adjusted as are also variocoupler 39, 40 and tuning condenser 38 until the wave pattern shown on the oscillograph first dissolves into a stationary single circle or ellipse. Generally speaking, the adjustment of the tuning condenser 33 not only changes the frequency at which the auxiliary system oscillates but also may be employed to vary 'assaau t I the phase of the auxiliary system output voltage mary winding 1 and fixed condenser I. The

until it is identical with the phase of the output voltage of the main oscillator system. The final adjustment as to amplitude then is obtained by 33, 40 until-the oscillograph pattern presents a straight horizontal line. The adjustment just output of tube 22- of this variable feedback oscillator is coupled through condenser 30 to'volume control potentiometer 32, the slider of which suitably varying the settings of the variocoupler 5 is connected to the grid of an amplifier tube 0.

described assumes, of course, that the article under test is of a "standard" nature.

All oscillators have a tendency to drift, which This circuit includes energizing coil or oscillator primary 3 connected in series with variocoupler tendency makes it dlillcult to maintain two free oscillatorsystems in continuous synchronism. This difficulty is overcome in the present invention by adjustingthe value of rheostat 45 until Potentiometer 32 controls the effective amplification of amplifier tube 3 and the output ofthis tube is connected to tuned circuit I which in electricalcharacteristics is similar to tuned circuit 2.

primary winding 3, the other half of the variocoupler primary coil being winding 4 above men-' tioned. Both primaries 8 and 3 are shunted by the resistance thereof is just enough to introduce the variable tuning condenser l0 The two enersufilcient coupling betweerLt'he two oscillators to assure a stationary image or pattern on the oscillograph screen under "standard conditions. It has been found that a rheostat 45 .having a resistance range of' from 0 to 25,000 ohms is the current flowing in primaries 3 and 3. The.

' differential output voltage of the two series-' satisfactory.

A testing arrangement of the type above described permits ,a quantitative investigation ofdefects 'or variations as well as an investigation of structural conditions by analysis of the con- 2 figuration and motion, if any, of the resultant oscillograph wave pattern, Slight variations from the arbitrarilydetermined electrical stand ard condition causes a tilting of the horizontal wave line, .or changes this line into a narrow ellipse. A .more serious defect will cause the ellipse to broadenand tilt and finally to change gizing coils or oscillator primaries 3 and 3 are inductively coupled respectively to concentrically arranged secondaries or detector ,coils ii and I2 which are connected in opposition with regard to connected" secondaries II and I2 which are shunted by tuning condenser 13 is coupled to an amplifier I 4 and may be indicated by means 01' meter l5. Tuning condenser I3 is connected across the leads to the indicating device to in-- crease the desired voltages and decrease the undesired voltages as described in connection with condenser N3 of Fig. l.

Amplifier l4 should be suitable for the frequencies employed in which event the meter It would be a suitable altemating-current indicat into a circle; while still more serious defects lng device, usuallyamilliammeter: or the amplichange the electrical characteristics of at least one of the oscillator systems to such an extent that it overcomes the synchronizing effect of rheostat whereby the oscillators will oscillate at difi'erent frequencies and will produce a slow or rapid revolution of the resultant wave pattern,

mentioned prior Patent No. 2,267,884. Tunedcircuit 1 together with amplifier 6 which feeds it maybe termed an-auxiliary circuit. This cirthe number of revolutions per unit of time being cult/to ether with auxiliary detector coil i2 coua function of the magnitude of the variation of the material from standard.

From the foregoing description it will be clear that through the use of an oseillo'graph' in connection with the double oscillator system of the present invention, it is possible to obtain considerably more information concerning the na 45 circuit 2, and detector coil ll coupled thereto.

,ture and magnitude of defects or changes in com position or form of the material than could be 5 spect to each other in Order a together hey obtained from the. usual indicating device of the meter type. Such information includes an indication of the full length of flaws as Has the magnitude thereof. However, the sys em illustrated in Fig. l is not suillciently sensitive to indicate extremely minute flaws or variations in the material which are sometimes of importance. Consequently, the preferred form of my invention includes not only all of the advantages above described in connection with the system of Fig. 1, so

but includes additional advantages including that of considerably increased sensitivity. Such a system will'now be described in connection with Fig. 2.

Referring to Fig. 2, oscillator I, which is similar tooscillator' I described above in connection with Fig. 1, is connected to a coil system which is similar to that illustrated in Fig. 1 of my mentioned prior application Serial No. 415,551. As

in the Fig. 1 arrangement,-the output of tube 2| mary 3 connected in series with. Variocoupler pripied thereto comprises an auxiliary system because it is employed to balance the main oscillator system which comprises oscillator l, tuned Variocoupler secondary coil 34 is common to both the auxiliary system and mainoscillator system. Currentfiows in opposite directions in coils 3 and 3 so it is vnecessary to reverse these coils with remay produce a single energizing field.' One of coils I l and I2 is then reversed with respect to this field to'provide the required balance.

Variocoupler 4-9, 34, reduces the 'efllciency I and stator windings to form amovable secondary coil and split primary coils. The purpose of this Variocoupler is to control the amplitude of the effective voltage induced in the secondary or'detector circuit, and; therefore, an alternative arrangement can be here employed which elimi- .nates the variocoupler and allows of fine adjust- I Fig. 2 will show that the frequency of the'alternating current fiowing in coil 3 is determined by the electrical constants of circuit 2, that a corresponding alternating voltage is impressed upon amplifier tube 6, and that the magnitude of the current of like frequency which flows in energizing coil 8 is controlled by adjustment of potentiometer 32. If the electrical constants of the two tuned circuits 2 and I are alike it is possible to make the voltage induced in secondaries II and I2 identical. In this case, of course, no deflection is shown at meter IS. The strength of the differential field impressed across condenser l3 may be varied considerably by suitable tuning of this circuit to or near the frequency of oscillator i. By uch tuning the voltage input to the amplifier i4 is increased and transfer of undesirable harmonics is decreased. Adjustment of potentiometers 24 and 3| may vary the frequency of the oscillator slightly. but this does not affect the essential operation because it may be compensated for.

As long as the specimen 20 under test is uniform the output of amplifier I4 will remain substantially zero, but as soon as a defect or otherwise different section of the specimen enters the field of coil 3 (assuming movement from left to right as indicated by the arrow), the tuning of circuit 2 changes and the oscillator operates at a different frequency. This upsets the balance between the secondary coils H and I2 which results in a deflection of meter IS. The amount of this deflection depends not only upon the nature of the disturbance, which in turn depends upon the nature of the defect and its effect upon the apparent inductance of coil 3, but also upon the adjustment of oscillator l with regard to the setting of feedback potentiometer 24 and the tuning of the secondary circuit ll, l2, l3. The mentioned change in apparent inductance of coil 3 not only causes the oscillator to operate at a different frequency, but also results in a change in the electrical characteristics of tuned circuit 2 so that it completely differs from that of tuned circuit 1 which then carries current at a frequency for which it was not originally adjusted. The result of this upset condition causes a pronounced indication of the meter l5 even for a most minute defect in the material under test, thus providing extraordinarily great sensitivity in the main oscillator and auxiliary systems under discussion.

In the system of Fig. 2 an auxiliary oscillator is provided in the manner described above in connection with Fig. 1, and similarly this oscillator together with its coil system may be termed an auxiliary oscillator system. In the system of Fig. 2 as in that of Fig. 1 there is also preferably employed an oscillograph 44 for indicating the magnitudes of changes in structurelor composition of the material under test, as described. The system of Fig. -2 differs from that of Fig. 1, not only as already indicated, but also in that the secondary circuit which includes coils 30, 36 and Ill, also includes a coil H2 which is coupled to energizing primary coil 8 of the auxiliary system. Thus the indicating device 44 is connected to coil III which is coupled in the main oscillator system, and to coils 40 and 36 coupled in the auxiliary oscillator system, and to coil 2 coupled in the auxiliary system. Thus a coil in each of the systems is connected to a coil coupled to each of the other systems, whereby the balance of the combined system depends not only upon balances in the separate systems but also upon balances between the systems. This interrelated balance provides an interrelated response and sensitivity greater than that of either system alone and superior to that of a mere summation of the systems.

The system of Fig. 2 may be adjusted as follows: Potentiometers 24 and 3i are first adjusted to place oscillator I itself in oscillating condition while indicating meter I5 is observed. Usually this meter will give a sudden high reading after which by careful manipulation of potentiometers -24 and 3| this reading can be carefully decreased to a low value indicating that the oscillator is oscillating, but not violently. Assuming that the specimen 20 under test, which may be either moving or stationary, is placed in inductive relation with the coils 3, 8, ll, l2, Ill, H2 and i6, direct current is first caused to flow in coil l6 by closure of switch l8. Next, tuning condenser l0 and potentiometer 32 are adjusted until meter l5 indicates a minimum reading, ordinarily substantially zero. Condenser I0 is employed to adjust the phase of the current in coil 8 in relation to the current in coil 3. Subsequent adjustment of varicoupler secondary coil 34 with respect to stationary primary windings 4 and 9 enables attainment of a fine adjustment in the secondary detector circuit including coils ii and I2; and because of the design of the variocoupler this adjustment may provide a range from positive to zero through negative values. Following this adjustment, the auxiliary oscillator system is adjusted as described above in connection with Fig. 1, while oscillograph 44 is observed. Because of the mutual coupling between the main and auxiliary oscillator systems, there is some interaction between the two, and this may make necessary readjustment of variocoupler 34 and occasionally of potentiometer 32 in order to obtain minimum indications on the indicating devices l5 and 44 under standard conditions before testing an unknown specimen.

After the foregoing adjustments have been made, indicating device [5 will indicate a transitory deflection whenever a defect or structural change comes within or leaves the magnetic influence of the coil system, and this will be true even of very minor defects because of the great sensitivity of the system to which the indicating device is coupled. On the other hand, the continuously displayed patterns on oscillograph 44 will indicate the full length of flaws or other variations passing through the fields of the test coils. By observing both indicating devices I 5 and 44, defects of substantially all types as well as variations in composition or form of the material itself can be instantly observed and identifled; and by observing oscillograph 44 can be measured as to magnitude. Thus the present invention provides in a single testing equipment not only great sensitivity but also the ability to indicate and measure substantially all types of eflect upon the test performancemi the specimen under observation. Without the superposition of a direct-current field, slight but meaningless changes in permeability of the material may be excessive for the extreme sensitivity of the present testing equipment. These undesired fluctuasuperposition is mentioned in Austrian Patent No. 98,935, published December 27, 1924, which discloses an alternating-current field combined with a direct-current field to obtain results which cannot be duplicated by using either alternatingcurrent or direct-current energization alone.

In order better to understand the operation of the system of the present invention it is helpful to analyze the changes in the apparent inductance of coils 3 and 8 when a metallic body passes through the fields of these coils. Assuming first that the conducting body is composed of a non-ferrous metal, then, according to well known laws, the passage of such a body increases the apparent resistance and lowers the apparent inductance of this coil. The same, of course,

holds true for a, body of ferrous material, except for the fact that its higher permeability checks the tendency of the inductance to drop and in most cases results in a somewhat higher inductance value. The increase caused by the of a direct-current field has a very beneficial Patent No. 2,267,8 84 the type of oscillatorhere described is afiected by changes in the tuned output circuit resulting in a pronounced amplitude change of the voltages impressed upon coils 3 and This characteristic is, however, desirable in the testing system of this invention because the variations in oscillator output are thereby more pronounced in the presence of defects or varia- .tions in; the material under test. Although as above stated, oscillators of the variable feedback type have provedto be preferable for the-uses indicated,other forms of oscillator could be employed especially to replace oscillator MI in Figs. 1 and 2 For example an audio-frequency oscillator of the heterodyne or of the negative resistance type could be employed.

Fig.3 is a schematic diagram showing the manner in which the coils comprising the coil assembly of Fig. 2 may be physically disposed so that the material under test passes through them. For clarity in the drawings, coil 13 has not been illustrated in Fig. 3, but it may be wound concentrically. with all of the other coils from coil IH to cell H2, and so as to envelope them if desired. With this coil arrangement lower frequencies can be employed than with the arrangement of Fig. 4. For example, frequencies in the neighborhood of 4,000 cycles can be employed.

Fig. 4, similarly, is a schematic diagram showing the manner in which the same coils as in Fig.

3 may be laterally displaced so that the material under test does not pass through them, but passes higher permeability is, however, not of a magnitude which would correspond to the actual permeabilityvalue. For instance, the passing of a steel bar having a permeability of 200 to 400 times the permeability of air through a concentrically disposed coll carrying alternating current at 60 cycles increases the inductance from 200% to 400% only. Upon increase of applied frequency, the apparent inductance due to the iron decreases and very soon drops to a value where it equals the inductance of an air-core coil. The frequency at which this equality occurs is sometimes called the critical frequency. It depends upon the grade and size of the material involved, and for solid material is found well within the range of the upper audio frequencies.

superimposing a D. C. (direct-current) field upon the field of an A. C. (alternating-current) energizing coil containing a ferro-magnetic body has the efiect of artificially lowering the value of critical frequency or the amount of apparent A. C. permeability. I have found that for higher frequencies the efi'ect of the superimposed D. C.

, field is more pronounced and, in other words,

less D. C. magnetization is required to make the material non-magnetic with relation to the applied A. C. Using lower frequencies of the order of 500 to 1,000 cycles, higher D. C. magnetization open magnetic circuits even by the most intense D. C. fields. The effect observed and ascribed7 by some investigators to magnetic "saturation" of the material, appears to represent simply the efi ect of the alternating'magnetlc phenomenon described above.

As pointed out in my mentioned copending in symmetrical relation through the fields of those coils, such as disclosed in my copending application for U. 8. Letters Patent Serial No. 334,790, filed May 13, 1940. This latter arrangement is frequently more convenient in connection with testing material at the mill, 'and with such eccentric arrangement it is not necessary to superimpose direct-current energization, so coil I6 is not here shown. Due to the small diameter of the coils preferably employed in this arrangement, somewhat higher frequencies, for example in the neighborhood of 15,000 cycles, may be employed. -The coil arrangements of Figs. 3 and 4 may also be takenas illustrations of alternative physical dispositions of the coils of Fig. 1-, insofar as corresponding coils are represented in those figures.

I claim:

1. In apparatus for electromagnetic inspection of material, the combination which comprises a main oscillator system having an output circuit,

an auxiliary oscillator system having an output circuit, a separate energizing coil connected in an output circuit of each of said oscillator systems and forming a tuning element thereof, a second-,

ary circuit diiierentially coupled to said oscillator systems,- an indicating device connected to said secondary system so as to indicate changes in magnitude and phase of the voltage induced in,said secondary circuit by said oscillator systems, adjustable means associated with at least one of said oscillators whereby to synchronize said oscillators,.and adjustable means associated .with said secondary circuit and one of said oscillator systems for balancing the voltage established in one of said energizing coils against the voltage established in the other of said. energizing coils while said oscillators are synchronized.

2. Inapparatus for, electromagnetic inspection of material, the combination which comprises a main oscillator system having an output circuit, an auxiliary oscillator system having an output circuit, a separate energizing coil connected in an output circuit of each of said oscillator systerns and forming a tuning element thereof, a secondary circuit differentially coupled to said oscillator systems, an indicating device connect-- tablished in one of said energizing coils against the voltage established in the other of said energizing coils.

3. In apparatus for electromagnetic inspection of material, the combination which comprises a main oscillator system including a variable feedback oscillator having an output circuit, an auxiliary oscillator system comprising a variable feedback oscillator having an output circuit, a separate energizing coil connected in an output circuit of each of said oscillator systems and forming a tuning element thereof, a secondary circuit differentially coupled to said oscillator systems through said energizing coils, an indi-, cating device connected to said secondary circuit so as to indicate changes in magnitude and phase of the voltage induced in said secondary circuit by said oscillator systems, control means associated with each oscillator for adjusting the output thereof, and adjustable means associated with said secondary circuit and one of said oscillator systems for balancing the voltage established across one of said energizing coils against the voltage established across the other of said energizing coils.

4. In apparatus for electromagnetic inspection of material, the combination which comprises a main oscillator system including a varible feedback oscillator having an output circuit;

an energizing coil connected in an output circuit of said main oscillator system and forming a tuning element thereof; an auxiliary oscillator system including a variable feedback oscillator having an output circuit comprising in series an auxiliary coil and a variocoupler primary coil, and a tuning condenser connected across said auxiliary and primary coils; a secondary circuit including a variocoupler secondary coil and two secondary coils coupled respectively to said energizing coil and to said auxiliary coil; means including said energizing coil and at least one of said secondary coils whereby said material may be disposed in inductive relation to said primary and secondary circuits; and indicating means connected tov said secondary circuit so as to indicate changes in magnitude and phase of voltage induced in said secondary circuit by said oscillator .systems.

of material, the combination which comprises a main oscillator system including a feedback oscillator, a tuned primary circuit comprising an energizing coil connected in shunt with a condenser, said primary circuit being effectively connected in an output circuit of said oscillator whereby said coil forms a tuning element of said oscillator; an auxiliary oscillator system including an auxiliary feedback oscillator, and a tuned primary circuit comprising an auxiliary coil connected in series with a primary winding of a variocoupler, and a tuning condenser connected in shunt with said auxiliary coil and primary winding; a secondary circuit comprising a first secondary coil coupled to said energizing coil and connected in circuit with a secondary winding of said variocoupler and with a second secondary coil which is coupled to said auxiliary coil; and indicating device one portion of which is coupled across said secondary winding and said second secondary coil and another portion of which is connected across all of the coils and windings in said secondary circuit; and means for passing said material through the fields of said energizing coil and of said first secondary coil.

8. In apparatus for electromagnetic inspection of material, the combination which comprises a main oscillator system including a feedback oscillator, a tuned primary circuit comprising an energizing coil connected in shunt with a condenser, said primary circuit being effectively connected in an output circuit of said oscillator whereby said coil forms a tuning element of said oscillator; an auxiliary oscillator system including an auxiliary feedback oscillator, and a tuned primary circuit comprising an auxiliary coil connected in series with a primary winding of a variocoupler, and a tuning condenser connected in shunt with said auxiliary coil and primary winding; a second circuit comprising a first secondary coil coupled to said energizing coil and connected in circuit with a secondary winding of said variocoupler and with a second secondary coil which is coupled to said auxiliary coil; an indicating device one portion of which is coupled across said secondary winding and said second secondary coil and another portion of which is connected across all of the coils and windings in said secondary circuit: means for adjusting the magnitude of the output of each of said oscillators; a direct-current coil and means for passing adjustably controllable direct current therethrough; and means for passing said material through the fields of said energizing coil said first secondary coil and said direct-current coil.

9. In apparatus for electromagnetic inspection of metallic material for variations in structure and composition, the combination which comprises a main oscillator system including a first feedback oscillator, a tuned primary circuit comprising an energizing coil connected in series with a first primary winding of a variocoupler, and a tuning condenser connected in shunt with said coil and winding, said primary circuit being effectively connected in an outputcircuit of said oscillator whereby said energizing coil forms a tuning element of said oscillator; an auxiliary system including a tuned primary circuit comprising a first auxiliary coil connected in series with a second primary winding of said variocoupler, a tuning condenser connected in shunt with said auxiliary coil and second primary winding, and an amplifier connected to couple an output circuit of said oscillator to said primary circuit of said auxiliary system; a detector circuit comprising a first detector coil coupled to said energizing coil and connected in series with a first variable condenser, with a second detector coil a first variocoupler secondary winding which-ls adiustably coupled to said first and second primary windings; an auxiliary variable feedback oscillator system including. a second variable feedback oscillator having an output circuit comprising in series a second auxiliary coil, a variocoupler primary coil and'a tuning condenser connected across said primary and second auxiliary coils; a secondary circuit including in se-; ries a second variocoupler secondar'y coil coupled to said variocoupler primary coll, a second variable condenser, a first secondary coil coupled to said first auxiliary coil, a second secondary coil coupled to said energizing coil, and a third secondary coil coupled to said second auxiliary coil; a first indicating device coupled across said firstvariable condenser; a second indicating device one portion of which is coupled across said second variocoupler secondary coil and said third secondary coil, and the other portion of which is coupled across all of the coils and windings in comprising an energizingcoil connected in series with a firstprimary winding of a variocoupier, and a tuning condenser connected in shunt with said coil and winding, said primary circuit being eiiectively connected in an output circuit seconda'ry'coil and said third secondary coil; and the other set of plates being coupled across all of the coils and windingsin said secondary "circuit;

means for adjusting the degree of amplification of said oscillator whereby said energizing coil forms a tuning element of said oscillator; an

cuit comprising a first auxiliary coil connected shunt with said auxiliary coil and second primary winding, and an amplifier connected to couple an output circuit of said oscillator to said primary circuit of said auxiliary system; a detector circuit comprising a first detector coil coupled to said energizing coil and connected in series with a first variable condenser, with a second detector coil which is coupled to said auxiliary coil and with a first variocoupler secondary winding which is adjustably coupled to said first and second primary windings; an auxiliary variable feedback oscillator system includin a second variable feedback oscillator having an output circuit comprising in series a second auxiliary coil, a variocoupler primary coil and a tuning condenser connected across said primary and second auxiliary coils; a secondary circuit including in series a second variocoupler secondary coil coupled to said variocoupler primary coil, a

secondvariable condenser, a first secondary coil coupled to said first auxiliary coil, a second secondary coil coupled to said energizing coil,.and a third secondary coil coupled to said second auxiliary coil; a first indicating device coupled across said first variable condenser; a second indicating device comprising an oscillograph having two sets of deflecting plates, one set of plates being coupled across said second variocoupler in series with a second primary winding of said variocoupler, a tuning condenser connected in of said amplifier; means for adjusting the magnitudes of the outputs of both of said oscillators;

a direct-current coil and means for passing adiustably controllable directv current there- 't rough; and means for passing said material through the fields of said energizing, and first auxiliary coils, said first and second detector coils, said first and second secondary coils and said direct-current coil.

12. Apparatus according to claimll includings vacuum tubes in said oscillators, a, source 0! anode potential for said vacuum tubes and an adjustable resistor connected in series with said source and in common to the anode circuits of said tubes whereby to synchronize said oscillae tors. a

13. In apparatus for electromagnetic inspec tion of metallicmateri al for variations in structure and composition, the combination which comprises a main oscillator system including a first feedback oscillator and a first tuned energizing coil connected in an output circuit of said oscillator whereby at least in part to determine the frequency of said oscillatoryand auxiliary system energized by said oscillator and including a first tuned auxiliary coil; an auxiliary oscillator system including a second feedback 0'scillator and a second tuned energizing coil connected in an output circuit of said auxiliary oscillator whereby-at least in part to determine the frequency of said auxiliary osolllatorpa secondary circuit including a first coil coupled to said energizing coil, a second coilcoupled to said first tuned auxiliary coil and a third coil coupled to said second tuned energizing coil; a detector circuit including a first detector coil coupled to said first tuned energizing coil and a second detector coil coupled to said first tuned auxiliary coil; indicating means coupled to a plurality of elements of said secondary circuit; indicating means coupled to at least one element of said detector circuit; and-means for passing said material through the fields of said first tuned ener- 'gizirg and auxiliary coils, said first and second coils in said secondary circuit, and said first and second detector coils.

14. In apparatus for electromagnetic inspec- Lion of metallic material for variations in structure and composition, the combination which comprises a main oscillator system including a first feedback oscillator and a first tuned energizingcoll connected in an output circuit of said oscillator whereby at least in part to determine the frequency of said oscillator; an auxiliary system energized by said oscillator and including an adlustably tunable circuit having a first auxiliary coil; an auxiliary oscillator system-including a second feedback oscillator and a second energizing coll adlustably tunable and connected in an output circuit of said auxiliary oscillator whereby in part to determine the frequency of said auxiliary oscillator; a secondary circuit including a first coil coupled to said energizing coil, a second coil coupled to said first auxiliary coil and a third coil coupled to said second energizing coil; a detector circuit including a first detector coil coupled to said first tuned energizing coil and a second detector coil coupled'to said first auxiliary coil; indicating means one element of said detector circuit; and means for passing said material through the fields of said first energizing and auxiliary coils, said first and second coils in said secondary circuit, and said first and second detector coils,

15. In apparatus for electromagnetic inspection of metallic material for variations in structure and composition, the combination which comprises, a main oscillator system including a first feedback oscillator and a first tuned energizing coil connected in an output circuit of said oscillator whereby at least in part to determine the frequency of said oscillator; an auxiliary system energized by said oscillator and including a first tuned auxiliary coil; an auxiliary oscillator system including a second feedback as,- cillator and a second tuned energizing coil connected in an output. circuit of said auxiliary oscillator whereby at least in part to determine the frequency of said auxiliary oscillator; a secondary circuit including a first coil coupled to said energizing coil, a second coil coupled to said first tuned auxiliary coil and a third coil coupled to said second tuned energizing coil; a detector circuit including a first detector coil coupled to said first tuned energizing coil and a second detector coil coupled to said first tuned auxiliary coil; indicating means coupled to a plurality of elements of said secondary circuit; indicating means coupled to at least one element of said detector circuit; means for ad- Justing the magnitude of the output of each said oscillator; a direct-current coil and'means for passing adiustably controllable direct currentoscillator systems, a secondary circuit coupled to both of said systems, means for diflerentially coupling said oscillator systems through said secondary circuit, means for balancing the voltages induced in said secondary circuit by both of said oscillator systems as to magnitude and phase, means for passing material to be inspected in inductive relation to elements of said secondary circuit and of one of said oscillator systems, and an indicating device coupled to said secondary circuit.

18. In apparatus for electromagnetic inspection of material, the combination which includes. two oscillator systems, each oscillator system including an oscillator of the feedback type, a secondary circuit including two coils each coupled to one of said oscillator systems, respectively, means for difierentialiy coupling a coil in each of said oscillator systems to one of said coils in said secondary circuit, respectively, means for balancing the voltages induced in said secondary circuit by both of said oscillator systems as to magnitude and phase, means for passing material to be inspected in inductive relation to a coil in one of said oscillator systems and to a coil in said secondary circuit, and an oscillograph coupled to said secondary circuit. a

19. In apparatus for electromagnetic inspection of material the combination which includes two oscillator systems, each oscillator system including an oscillator of the feedback type, a secondary circuit including two coils each coupled to one of said oscillator systems, respectively, means for balancing the voltages induced in said secondary circuit by both of said oscillator systems as to magnitude and phase, means for impressing a voltage induced in one of said secondary coils across one of said sets of plates, means for impressing the sum of the voltages induced in both of said coils across the other of said sets of plates, means for passing material to be inspected in inductive relation to coils in said secondary circuit and to a coil in one of said oscillator systems, and-an oscillograph having two sets of deflection plates connected to said secondary circuit.

THEODORE ZUSCHLAG. 

